On the adhesion between fine particles and nanocontacts: An atomic force 
microscope study

Farshchi-Tabrizi, M.; Kappl, Michael; Cheng, Y. J.; Gutmann, Jochen; Butt, Hans-Jürgen

doi:10.1021/la052760z

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On the adhesion between fine particles and nanocontacts: An atomic force microscope study

Farshchi-Tabrizi, M., Kappl, M., Cheng, Y. J., Gutmann, J., & Butt, H.-J. (2006). On the adhesion between fine particles and nanocontacts: An atomic force microscope study. Langmuir, 22(5), 2171-2184. doi:10.1021/la052760z.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-7F46-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-4601-7

Genre: Journal Article

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Creators:
Farshchi-Tabrizi, M.¹, Author
Kappl, Michael², Author
Cheng, Y. J.², Author
Gutmann, Jochen², Author
Butt, Hans-Jürgen², Author

Affiliations:
1Bu Ali Sina Univ, Hamedan, Iran, ou_persistent22
2MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 2006

Publication Status: Issued

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Identifiers: eDoc: 260945
Other: P-06-202
DOI: 10.1021/la052760z

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Title: Langmuir

Source Genre: Journal

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Publ. Info: Columbus, OH : American Chemical Society

Pages: - Volume / Issue: 22 (5) Sequence Number: - Start / End Page: 2171 - 2184 Identifier: ISSN: 0743-7463
CoNE: https://pure.mpg.de/cone/journals/resource/954925541194