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  Modified atomic force microscope for high-rate dynamic force spectroscopy

Ptak, A., Kappl, M., & Butt, H.-J. (2006). Modified atomic force microscope for high-rate dynamic force spectroscopy. Applied Physics Letters, 88(26): 263109. doi:10.1063/1.2218273.

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 Creators:
Ptak, A.1, Author           
Kappl, Michael1, Author           
Butt, Hans-Jürgen1, Author           
Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545              

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Language(s): eng - English
 Dates: 2006
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 284846
Other: P-06-93
DOI: 10.1063/1.2218273
 Degree: -

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Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 88 (26) Sequence Number: 263109 Start / End Page: - Identifier: Other: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223