Modified atomic force microscope for high-rate dynamic force spectroscopy

Ptak, A.; Kappl, Michael; Butt, Hans-Jürgen

doi:10.1063/1.2218273

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Modified atomic force microscope for high-rate dynamic force spectroscopy

Ptak, A., Kappl, M., & Butt, H.-J. (2006). Modified atomic force microscope for high-rate dynamic force spectroscopy. Applied Physics Letters, 88(26): 263109. doi:10.1063/1.2218273.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-802D-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-CAE1-9

Genre: Journal Article

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Creators:
Ptak, A.¹, Author
Kappl, Michael¹, Author
Butt, Hans-Jürgen¹, Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Published in Print: 2006

Publication Status: Published in print

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Rev. Type: -

Identifiers: eDoc: 284846
Other: P-06-93
DOI: 10.1063/1.2218273

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Title: Applied Physics Letters

Abbreviation : Appl. Phys. Lett.

Source Genre: Journal

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Publ. Info: Melville, NY : American Institute of Physics

Pages: - Volume / Issue: 88 (26) Sequence Number: 263109 Start / End Page: - Identifier: Other: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223