Electrostatic forces acting on tip and cantilever in atomic force microscopy

Bonaccurso, Elmar; Schönfeld, F.; Butt, Hans-Jürgen

doi:10.1103/PhysRevB.74.085413

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Electrostatic forces acting on tip and cantilever in atomic force microscopy

Bonaccurso, E., Schönfeld, F., & Butt, H.-J. (2006). Electrostatic forces acting on tip and cantilever in atomic force microscopy. Physical Review B, 74(8): 085413. doi:10.1103/PhysRevB.74.085413.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-809D-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-18DE-C

Genre: Journal Article

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Creators:
Bonaccurso, Elmar¹, Author
Schönfeld, F., Author
Butt, Hans-Jürgen¹, Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 2006

Publication Status: Issued

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Identifiers: eDoc: 288938
Other: P-06-111
DOI: 10.1103/PhysRevB.74.085413

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Title: Physical Review B

Abbreviation : Phys. Rev. B

Source Genre: Journal

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Publ. Info: Woodbury, NY : American Physical Society

Pages: - Volume / Issue: 74 (8) Sequence Number: 085413 Start / End Page: - Identifier: ISSN: 1098-0121
CoNE: https://pure.mpg.de/cone/journals/resource/954925225008