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  High-precision laser-assisted absolute determination of x-ray diffraction angles.

Kubicek, K., Braun, J., Bruhns, H., Crespo Lopez-Urrutia, J. R., Mokler, P. H., & Ullrich, J. (2012). High-precision laser-assisted absolute determination of x-ray diffraction angles. Review of Scientific Instruments, 83(1): 013102. doi:10.1063/1.3662412.

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Kubicek, K.1, Author           
Braun, J., Author
Bruhns, H., Author
Crespo Lopez-Urrutia, J. R., Author
Mokler, P. H., Author
Ullrich, J., Author
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1Research Group of Structural Dynamics of (Bio)chemical Systems, MPI for biophysical chemistry, Max Planck Society, ou_578564              

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 Abstract: A novel technique for absolute wavelength determination in high-precision crystal x-ray spectroscopy recently introduced has been upgraded reaching unprecedented accuracies. The method combines vis- ible laser beams with the Bond method, where Bragg angles ( θ and − θ ) are determined without any x- ray reference lines. Using flat crystals this technique makes absolute x-ray wavelength measurements feasible even at low x-ray fluxes. The upgraded spectrometer has been used in combination with first experiments on the 1 s 2 p 1 P 1 → 1 s 21 S 0 w -line in He-like argon. By resolving a minute curvature of the x-ray lines the accuracy reaches there the best ever reported value of 1 . 5ppm. The result is sensitive to predicted second-order QED contributions at the level of two-electron screening and two- photon radiative diagrams and will allow for the first time to benchmark predicted binding energies for He-like ions at this level of precision.

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Language(s): eng - English
 Dates: 2012-01-042012
 Publication Status: Issued
 Pages: 8
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1063/1.3662412
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Title: Review of Scientific Instruments
Source Genre: Journal
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Pages: - Volume / Issue: 83 (1) Sequence Number: 013102 Start / End Page: - Identifier: -