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  Intrinsic Noise and Temperature Coefficients of Selected Voltage References

Fleddermann, R., Tröbs, M., Steier, F., Heinzel, G., & Danzmann, K. (2009). Intrinsic Noise and Temperature Coefficients of Selected Voltage References. IEEE Transactions on Instrumentation and Measurement, 58(6), 2002-2007.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0013-4659-8 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0013-465A-6
Genre: Journal Article

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Fleddermann, R.1, Author              
Tröbs, M.1, Author              
Steier, F.1, Author              
Heinzel, G.1, Author              
Danzmann, K.1, Author              
Affiliations:
1Laser Interferometry & Gravitational Wave Astronomy, AEI-Hannover, MPI for Gravitational Physics, Max Planck Society, ou_24010              

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 Abstract: We require voltage references with a relative output voltage noise of at most 10(-6)/root Hz in the frequency range of 0.1 mHz-1 Hz. We have investigated the output voltage noise and the external noise sources of a selection of references. Two external noise sources, i.e., supply voltage and temperature, and their coupling to the output voltage of the references were studied. The effect of supply voltage noise was negligible, whereas temperature noise had to be suppressed by stabilization. We found that samples of AD587LN- and MAX6126AASA50-type references fulfilled the requirements if the ambient temperature was stabilized to a level of approximately 50 mK/root Hz.

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 Dates: 2009
 Publication Status: Published in print
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 Rev. Method: -
 Identifiers: eDoc: 435374
ISI: 000266173900023
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Title: IEEE Transactions on Instrumentation and Measurement
Source Genre: Journal
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Pages: - Volume / Issue: 58 (6) Sequence Number: - Start / End Page: 2002 - 2007 Identifier: ISSN: 0018-9456