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  State-of-the-art attosecond metrology

Schultze, M., Wirth, A., Grguras, I., Uiberacker, M., Uphues, T., Verhoef, A. J., et al. (2011). State-of-the-art attosecond metrology. Journal of Electron Spectroscopy and Related Phenomena, 184(3-6 Sp. Iss. Sp. Iss. SI), 68-77. doi:10.1016/j.elspec.2011.01.003.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-000F-AE04-0 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-000F-AE05-E
Genre: Journal Article

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4169.pdf (Publisher version), 2MB
 
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 Creators:
Schultze, Martin1, Author              
Wirth, Adrian2, 3, Author              
Grguras, Ivanka4, Author              
Uiberacker, Matthias4, Author              
Uphues, Thorsten2, Author              
Verhoef, Aart J.4, Author              
Gagnon, Justin4, Author              
Hofstetter, M., Author
Kleineberg, U.4, Author              
Goulielmakis, Eleftherios3, Author              
Krausz, Ferenc4, Author              
Affiliations:
1Attosecond Dynamics, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445573              
2Attosecond Imaging, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445574              
3Attoelectronics, Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445572              
4Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564              

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Language(s): eng - English
 Dates: 2011-04
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: Peer
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Title: Journal of Electron Spectroscopy and Related Phenomena
Source Genre: Journal
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Pages: - Volume / Issue: 184 (3-6 Sp. Iss. Sp. Iss. SI) Sequence Number: - Start / End Page: 68 - 77 Identifier: -