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  Development of a Soft-X-Ray Spectrometer for the Characterization of a Laser-driven Undulator Source

Zeitler, B. (2010). Development of a Soft-X-Ray Spectrometer for the Characterization of a Laser-driven Undulator Source. Diploma Thesis, LMU, München.

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 Creators:
Zeitler, Benno1, Author              
Affiliations:
1Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564              

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Language(s): eng - English
 Dates: 2010-06-01
 Publication Status: Accepted / In Press
 Pages: -
 Publishing info: München : LMU
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 478407
 Degree: Diploma

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