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  Atom-chip-based generation of entanglement for quantum metrology

Riedel, M. F., Böhi, P., Li, Y., Hänsch, T. W., Sinatra, A., & Treutlein, P. (2010). Atom-chip-based generation of entanglement for quantum metrology. Nature, 464(7292), 1170-1173. doi:10.1038/nature08988.

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 Creators:
Riedel, Max F.1, Author           
Böhi, Pascal1, Author           
Li, Yun, Author
Hänsch, T. W.1, Author           
Sinatra, Alice, Author
Treutlein, Philipp1, Author           
Affiliations:
1Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445568              

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Language(s): eng - English
 Dates: 2010-04-22
 Publication Status: Published in print
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 Rev. Type: Peer
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Title: Nature
Source Genre: Journal
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Pages: - Volume / Issue: 464 (7292) Sequence Number: - Start / End Page: 1170 - 1173 Identifier: -