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  Entanglement interferometry for precision measurement of atomic scattering properties

Widera, A., Mandel, O., Greiner, M., Kreim, S., Hänsch, T. W., & Bloch, I. (2004). Entanglement interferometry for precision measurement of atomic scattering properties. Physical Review Letters, 92(16): 160406. doi:10.1103/PhysRevLett.92.160406.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-000F-BEB6-5 Version Permalink: http://hdl.handle.net/21.11116/0000-0004-F507-0
Genre: Journal Article

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 Creators:
Widera, Arthur1, Author              
Mandel, Olaf1, Author              
Greiner, Markus1, Author              
Kreim, Susanne1, Author              
Hänsch, T. W.1, Author              
Bloch, Immanuel2, Author              
Affiliations:
1Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445568              
2Quantum Many Body Systems, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445570              

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Language(s): eng - English
 Dates: 2004-04-23
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 211240
ISI: 000220993100006
URI: http://link.aps.org/abstract/PRL/v92/e160406
DOI: 10.1103/PhysRevLett.92.160406
arXiv: 0310719
Other: 2830
 Degree: -

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Title: Physical Review Letters
  Abbreviation : Phys. Rev. Lett.
Source Genre: Journal
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Publ. Info: Woodbury, N.Y. : American Physical Society
Pages: - Volume / Issue: 92 (16) Sequence Number: 160406 Start / End Page: - Identifier: ISSN: 0031-9007
CoNE: https://pure.mpg.de/cone/journals/resource/954925433406_1