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  High Resolution Spectroscopy of a Single In+ Ion

Becker, T., Eichenseer, M., Nevsky, A. Y., Peik, E., Schwedes, C., Skvortsov, M. N., et al. (2002). High Resolution Spectroscopy of a Single In+ Ion. In P. Gill (Ed.), Proceedings of the 6th Symposium on Frequency Standards and Metrology (pp. 107-114). New Jersey: World Scientific.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-C285-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-C286-E
Genre: Conference Paper

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 Creators:
Becker, Thomas1, 2, Author           
Eichenseer, Mario2, Author           
Nevsky, Alexander Y.2, Author           
Peik, Ekkehard2, Author           
Schwedes, Christian2, Author           
Skvortsov, M. N., Author
von Zanthier, Joachim2, Author           
Walther, Herbert2, Author           
Affiliations:
1Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445568              
2Laser Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445566              

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Language(s): eng - English
 Dates: 2002
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 15718
 Degree: -

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Title: 6th Symposium on Frequency Standards and Metrology
Place of Event: St. Andrews Univ., Fife, Scotland
Start-/End Date: 2001-09-09 - 2001-09-14

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Title: Proceedings of the 6th Symposium on Frequency Standards and Metrology
Source Genre: Proceedings
 Creator(s):
Gill, P., Editor
Affiliations:
-
Publ. Info: New Jersey : World Scientific
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 107 - 114 Identifier: -