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  Frequency Comparison of I2 Stabilized Lasers at 532 nm and Absolute Frequency Measurement of I2 Absorption Lines

Nevsky, A. Y., Holzwarth, R., Zimmermann, M., Udem, T., Hänsch, T. W., von Zanthier, J., et al. (2002). Frequency Comparison of I2 Stabilized Lasers at 532 nm and Absolute Frequency Measurement of I2 Absorption Lines. In P. Gill (Ed.), Proceedings of the 6th Symposium on Frequency Standards and Metrology (pp. 521-523). New Jersey: World Scientific.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-000F-C28D-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0018-D004-A
Genre: Conference Paper

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 Creators:
Nevsky, Alexander Y.1, Author              
Holzwarth, Ronald2, Author              
Zimmermann, Marcus2, Author              
Udem, Thomas2, Author              
Hänsch, T. W.2, Author              
von Zanthier, Joachim1, Author              
Walther, Herbert1, Author              
Pokasov, Pavel V.2, Author              
Skvortsov, M. N., Author
Bagayev, S. N., Author
Schnatz, H., Author
Riehle, F., Author
Affiliations:
1Laser Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445566              
2Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445568              

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Language(s): eng - English
 Dates: 2002
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 15730
 Degree: -

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Title: 6th Symposium on Frequency Standards and Metrology
Place of Event: St. Andrews Univ., Fife, Scotland
Start-/End Date: 2001-09-09 - 2001-09-14

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Title: Proceedings of the 6th Symposium on Frequency Standards and Metrology
Source Genre: Proceedings
 Creator(s):
Gill, P., Editor
Affiliations:
-
Publ. Info: New Jersey : World Scientific
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 521 - 523 Identifier: -