English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Precision Optical Frequency Metrology Using Pulsed Lasers

Udem, T., Holzwarth, R., Zimmermann, M., & Hänsch, T. W. (2002). Precision Optical Frequency Metrology Using Pulsed Lasers. In Y. A. Ono, & K. Fujikawa (Eds.), Foundations of Quantum Mechanics in the Light of New Technology: Proceedings of the 7th International Symposium (pp. 253-258). Singapore: World Scientific.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Udem, Thomas1, Author              
Holzwarth, Ronald1, Author              
Zimmermann, Marcus1, Author              
Hänsch, T. W.1, Author              
Affiliations:
1Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445568              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2002
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 24510
 Degree: -

Event

show
hide
Title: ISQM - Tokyo '01
Place of Event: Tokyo
Start-/End Date: 2002-08-27 - 2002-08-30

Legal Case

show

Project information

show

Source 1

show
hide
Title: Foundations of Quantum Mechanics in the Light of New Technology: Proceedings of the 7th International Symposium
Source Genre: Proceedings
 Creator(s):
Ono, Yoshimasa A., Editor
Fujikawa, Kazuo, Editor
Affiliations:
-
Publ. Info: Singapore : World Scientific
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 253 - 258 Identifier: ISBN: 981-238-130-9