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  On the reliability of reverse engineering results

Amotchkina, T. V., Trubetskov, M. K., Pervak, V., Romanov, B., & Tikhonravov, A. V. (2012). On the reliability of reverse engineering results. Applied Optics, 51(22), 5543-5551. doi:10.1364/AO.51.005543.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-EF1F-1 Version Permalink: https://hdl.handle.net/21.11116/0000-0004-4A63-A
Genre: Journal Article

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4402.pdf (Publisher version), 411KB
 
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 Creators:
Amotchkina, Tatiana V.1, Author
Trubetskov, Michael K.2, Author           
Pervak, Vladimir1, Author
Romanov, Boris1, Author
Tikhonravov, Alexander V.1, Author
Affiliations:
1external, ou_persistent22              
2Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564              

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Language(s): eng - English
 Dates: 20122012-08-01
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1364/AO.51.005543
Other: 4402
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Title: Applied Optics
Source Genre: Journal
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Publ. Info: Washington, DC : Optical Society of America
Pages: - Volume / Issue: 51 (22) Sequence Number: - Start / End Page: 5543 - 5551 Identifier: ISSN: 0003-6935
CoNE: https://pure.mpg.de/cone/journals/resource/991042728167604
Other: 4402