Statistical inference and multiple testing correction in classification-based 
multi-voxel pattern analysis (MVPA): random permutations and cluster size 
control

Stelzer, Johannes; Chen, Yi; Turner, Robert

Local TagsRelease HistoryDetailsSummary

Statistical inference and multiple testing correction in classification-based multi-voxel pattern analysis (MVPA): random permutations and cluster size control

Stelzer, J., Chen, Y., & Turner, R. (2011). Statistical inference and multiple testing correction in classification-based multi-voxel pattern analysis (MVPA): random permutations and cluster size control. Poster presented at Society for Neuroscience Annual Meeting, Washington, DC, USA.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-10A7-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-BF89-3

Genre: Poster

Files

show Files

Locators

show

Creators

show

hide

Creators:
Stelzer, Johannes¹, Author
Chen, Yi², Author
Turner, Robert³, Author

Affiliations:
1Max Planck Research Group Music Cognition and Action, MPI for Human Cognitive and Brain Sciences, Max Planck Society, ou_634555
2Max Planck Fellow Research Group Attention and Awareness, MPI for Human Cognitive and Brain Sciences, Max Planck Society, ou_634553
3Department Neurophysics, MPI for Human Cognitive and Brain Sciences, Max Planck Society, ou_634550

Content

show

Details

show

hide

Language(s):

Dates: Created: 2011-11

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

hide

Title: Society for Neuroscience Annual Meeting

Place of Event: Washington, DC, USA

Start-/End Date: 2011-11-12 - 2011-11-16

Legal Case

show

Project information

show

Source

show