Local density profiles in thin films and multilayers from diffuse x-ray and 
neutron scattering

Rauscher, M.; Reichert, H.; Engemann, S.; Dosch, H.

doi:10.1103/PhysRevB.72.205401

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Local density profiles in thin films and multilayers from diffuse x-ray and neutron scattering

Rauscher, M., Reichert, H., Engemann, S., & Dosch, H. (2005). Local density profiles in thin films and multilayers from diffuse x-ray and neutron scattering. Physical Review B, 72(20): 205401. doi:10.1103/PhysRevB.72.205401.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-264E-9 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-264F-7

Genre: Zeitschriftenartikel

Alternativer Titel : Phys. Rev. B

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Urheber:
Rauscher, M.¹, Autor
Reichert, H.², Autor
Engemann, S.², Autor
Dosch, H.^{2, 3}, Autor

Affiliations:
1Dept. Theory of Inhomogeneous Condensed Matter, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497643
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
3Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22