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  Critical adsorption at chemically structured substrates

Sprenger, M., Schlesener, F., & Dietrich, S. (2005). Critical adsorption at chemically structured substrates. Physical Review E, 71(5): 056125. doi:10.1103/PhysRevE.71.056125.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2756-9 Version Permalink: https://hdl.handle.net/21.11116/0000-0007-E1F9-2
Genre: Journal Article

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 Creators:
Sprenger, M.1, 2, Author           
Schlesener, F.1, 2, Author           
Dietrich, S.1, 2, Author           
Affiliations:
1Dept. Theory of Inhomogeneous Condensed Matter, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497643              
2Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Dietrich; Critical Phenomena
 Abstract: -

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Language(s): eng - English
 Dates: 2005-05-272005-05
 Publication Status: Issued
 Pages: 13
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 233561
DOI: 10.1103/PhysRevE.71.056125
 Degree: -

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Title: Physical Review E
  Other : Phys. Rev. E
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Melville, NY : American Physical Society
Pages: - Volume / Issue: 71 (5) Sequence Number: 056125 Start / End Page: - Identifier: ISSN: 1539-3755
CoNE: https://pure.mpg.de/cone/journals/resource/954925225012