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How well does total electron yield measure x-ray absorption in nanoparticles?

Fauth, K. (2004). How well does total electron yield measure x-ray absorption in nanoparticles? Applied Physics Letters, 85(15), 3271-3273. doi:10.1063/1.1804600.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-289E-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-289F-1

Genre: Journal Article

Alternative Title : Appl. Phys. Lett.

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Creators:
Fauth, K.¹, Author

Affiliations:
1Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648

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Free keywords: MPI für Metallforschung; Abt. Schütz;

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Language(s): eng - English

Dates: Date issued: 2004-10-19

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 201615
DOI: 10.1063/1.1804600

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Title: Applied Physics Letters

Alternative Title : Appl. Phys. Lett.

Source Genre: Journal

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Pages: - Volume / Issue: 85 (15) Sequence Number: - Start / End Page: 3271 - 3273 Identifier: -