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  Size effect on crack formation in Cu/Ta and Ta/Cu/Ta thin film systems

Gruber, P., Böhm, J., Wanner, A., Sauter, L., Spolenak, R., & Arzt, E. (2004). Size effect on crack formation in Cu/Ta and Ta/Cu/Ta thin film systems. In P. Anderson, T. Foecke, A. Misra, & R. Rudd (Eds.), Nanoscale Materials and Modeling-Relations Among Processing, Microstructure and Mechanical Properties (pp. P.2.7.1-P.2.7.7). Boston: Materials Research Society.

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 Creators:
Gruber, P.1, Author           
Böhm, J.1, Author           
Wanner, A.1, Author           
Sauter, L.1, Author           
Spolenak, R.1, Author           
Arzt, E.1, 2, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt; diffraction, thin films, Cu, Ta, fracture, synchrotron radiation
 Abstract: -

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Language(s): eng - English
 Dates: 2004-06-20
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 174819
 Degree: -

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Title: Nanoscale Materials and Modeling-Relations Among Processing, Microstructure and Mechanical Properties . Symposium at the MRS Spring Meeting 2004
Place of Event: San Francisco
Start-/End Date: 2004-04-12 - 2004-04-16

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Title: Nanoscale Materials and Modeling-Relations Among Processing, Microstructure and Mechanical Properties
Source Genre: Proceedings
 Creator(s):
Anderson, P.M., Editor
Foecke, T., Editor
Misra, A., Editor
Rudd, R.E., Editor
Affiliations:
-
Publ. Info: Boston : Materials Research Society
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: P.2.7.1 - P.2.7.7 Identifier: -

Source 2

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Title: Materials Research Society Proceedings
Source Genre: Series
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Publ. Info: -
Pages: - Volume / Issue: 821 Sequence Number: - Start / End Page: - Identifier: -