Structure, morphology, and optical properties of thin film of F16CuPc grown on 
silicondioxide

Ossó, J. O.; Schreiber, F.; Alonso, M. I.; Barrena, E.; Dosch, H.

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Structure, morphology, and optical properties of thin film of F₁₆CuPc grown on silicondioxide

Ossó, J. O., Schreiber, F., Alonso, M. I., Barrena, E., & Dosch, H. (2004). Structure, morphology, and optical properties of thin film of F₁₆CuPc grown on silicondioxide. Organic Electronics, 5(1 - 3), 135-140.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-296E-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-296F-5

Genre: Journal Article

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Creators:
Ossó, J. O.¹, Author
Schreiber, F.², Author
Alonso, M. I., Author
Barrena, E.¹, Author
Dosch, H.^{1, 3}, Author

Affiliations:
1Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
2Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
3Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Dosch;

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Language(s): eng - English

Dates: Date issued: 2004-03

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 174100

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Title: Organic Electronics

Source Genre: Journal

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Pages: - Volume / Issue: 5 (1 - 3) Sequence Number: - Start / End Page: 135 - 140 Identifier: -