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  Microstructure characterization of precursor-derived Si-C-N ceramics before and after creep testing

Cai, Y., Zimmermann, A., Bauer, A., & Aldinger, F. (2003). Microstructure characterization of precursor-derived Si-C-N ceramics before and after creep testing. Acta Materialia, 51(9), 2675-2683.

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 Creators:
Cai, Y.1, Author           
Zimmermann, A.1, Author           
Bauer, A.1, Author           
Aldinger, F.1, 2, Author           
Affiliations:
1Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497654              
2Universität Stuttgart, Institut für Nichtmetallische Anorganische Materialien, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Aldinger; transmission electron microscopy (TEM); crystallization; oxidation; interface structure; Si-C-N ceramic
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Language(s): eng - English
 Dates: 2003-05-23
 Publication Status: Issued
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 65119
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Title: Acta Materialia
Source Genre: Journal
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Pages: - Volume / Issue: 51 (9) Sequence Number: - Start / End Page: 2675 - 2683 Identifier: -