Recent progress with high resolution X-ray microscopy at the XM-1

Denbeaux, G.; Schneider, G.; Pearson, A.; Chao, W.; Bates, B.; Harteneck, B.; Olynick, D.; Anderson, E.; Fischer, P.; Juenger, M.

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Recent progress with high resolution X-ray microscopy at the XM-1

Denbeaux, G., Schneider, G., Pearson, A., Chao, W., Bates, B., Harteneck, B., et al. (2003). Recent progress with high resolution X-ray microscopy at the XM-1. Journal de Physique IV, 104, 9-9.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2D03-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2D04-4

Genre: Journal Article

Alternative Title : J. Phys. IV

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Creators:
Denbeaux, G.¹, Author
Schneider, G.¹, Author
Pearson, A.¹, Author
Chao, W.¹, Author
Bates, B.¹, Author
Harteneck, B.¹, Author
Olynick, D.¹, Author
Anderson, E.¹, Author
Fischer, P.², Author
Juenger, M.¹, Author

Affiliations:
1Lawrence Berkeley Natl Lab, Ctr Xray Opt, Berkeley, CA 94720 USA.; Univ Calif Berkeley, Dept Civil & Environm Engn, Berkeley, CA 94720 USA., ou_persistent22
2Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648

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Free keywords: MPI für Metallforschung; Abt. Schütz;

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Language(s): eng - English

Dates: Date issued: 2003-03

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 112039
ISI: 000183273900005

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Title: Journal de Physique IV

Alternative Title : J. Phys. IV

Source Genre: Journal

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Pages: - Volume / Issue: 104 Sequence Number: - Start / End Page: 9 - 9 Identifier: ISSN: 1155-4339