Plasmon energy mapping in energy-filtering transmission electron microscopy

Sigle, W.; Krämer, S.; Varshney, V.; Zern, A.; Eigenthaler, U.; Rühle, M.

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Plasmon energy mapping in energy-filtering transmission electron microscopy

Sigle, W., Krämer, S., Varshney, V., Zern, A., Eigenthaler, U., & Rühle, M. (2003). Plasmon energy mapping in energy-filtering transmission electron microscopy. Ultramicroscopy, 96, 565-571.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2DE5-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2DE6-8

Genre: Journal Article

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Creators:
Sigle, W.^{1, 2}, Author
Krämer, S.¹, Author
Varshney, V.³, Author
Zern, A.¹, Author
Eigenthaler, U.^{1, 4}, Author
Rühle, M.¹, Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
3Indian Institute of Technolgy, Kanpur 208016, India. Materials Department, University of California at Santa Barbara, Santa Barbara, CA 93106, USA Balhuff GmbH, Gartenstraße 21-25, D-73765 Neuhausen a.d.F., Germany, ou_persistent22
4Scientific Staff Assembly Dual Beam, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497668

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Free keywords: MPI für Metallforschung; Abt. Rühle;

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 51282

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Title: Ultramicroscopy

Source Genre: Journal

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Pages: - Volume / Issue: 96 Sequence Number: - Start / End Page: 565 - 571 Identifier: -