Advances in EELS spectroscopy by using new detector and new specimen 
preparation technologies

Scheu, C.; Gao, M.; van Benthem, K.; Tsukimoto, S.; Schmidt, S.; Sigle, W.; Richter, G.; Thomas, J.

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Advances in EELS spectroscopy by using new detector and new specimen preparation technologies

Scheu, C., Gao, M., van Benthem, K., Tsukimoto, S., Schmidt, S., Sigle, W., et al. (2003). Advances in EELS spectroscopy by using new detector and new specimen preparation technologies. Journal of Microscopy, 210, 16-24.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2DF9-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2DFB-9

Genre: Journal Article

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Creators:
Scheu, C.¹, Author
Gao, M.¹, Author
van Benthem, K.¹, Author
Tsukimoto, S.¹, Author
Schmidt, S.¹, Author
Sigle, W.¹, Author
Richter, G.^{1, 2}, Author
Thomas, J.¹, Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640

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Free keywords: MPI für Intelligente Systeme; Ehem. Abt. Rühle;

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 53020

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Title: Journal of Microscopy

Source Genre: Journal

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Pages: - Volume / Issue: 210 Sequence Number: - Start / End Page: 16 - 24 Identifier: -