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  ARHVTEM of the Pd/ZnO heterointerface chemical structure

Murakami, K., Saito, M., Takuma, E., & Ichinose, H. (2003). ARHVTEM of the Pd/ZnO heterointerface chemical structure. Journal of Electron Microscopy, 52(1), 27-32.

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Genre: Journal Article
Alternative Title : J. Electron Microsc.

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 Creators:
Murakami, K.1, Author
Saito, M.2, 3, Author              
Takuma, E.1, Author
Ichinose, H.1, Author
Affiliations:
1Univ Tokyo, Dept Mat Sci, Sch Engn, Tokyo 1130033, Japan.;, ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Free keywords: MPI für Metallforschung; Abt. Rühle; HVTEM, ZnO/Pd interface, interface chemical structure, internal oxidation, projected potential image
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Language(s): eng - English
 Dates: 2003
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 112701
ISI: 000182216800005
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Title: Journal of Electron Microscopy
  Alternative Title : J. Electron Microsc.
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 52 (1) Sequence Number: - Start / End Page: 27 - 32 Identifier: ISSN: 0022-0744