Direction Dependent Grain-Interaction Models for the Diffraction Stress 
Analysis of Thin Films

Welzel, U.; Leoni, M.; Mittemeijer, E. J.

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Direction Dependent Grain-Interaction Models for the Diffraction Stress Analysis of Thin Films

Welzel, U., Leoni, M., & Mittemeijer, E. J. (2002). Direction Dependent Grain-Interaction Models for the Diffraction Stress Analysis of Thin Films. In C. Ozkan, R. Cammarata, L. Freund, & H. Gao (Eds.), Thin Films: Stresses and Mechanical Properties IX (pp. L1.3.1-L1.3.6). Warrendale, PA: MRS.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-331C-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-331D-1

Genre: Conference Paper

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Creators:
Welzel, U.¹, Author
Leoni, M., Author
Mittemeijer, E. J.^{1, 2}, Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer; 21-mi_2002;

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Language(s): eng - English

Dates: Date issued: 2002

Publication Status: Issued

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Identifiers: eDoc: 13069

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Title: Thin Films: Stresses and Mechanical Properties IX. Symposium

Place of Event: Boston, Mass. [USA]

Start-/End Date: 2001-11-26 - 2001-11-30

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Title: Thin Films: Stresses and Mechanical Properties IX

Source Genre: Proceedings

Creator(s):
Ozkan, C.S., Editor
Cammarata, R.C., Editor
Freund, L.B., Editor
Gao, H.¹, Editor

Affiliations:
1 Former Dept. Theory of Mesoscopic Phenomena, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497656

Publ. Info: Warrendale, PA : MRS

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: L1.3.1 - L1.3.6 Identifier: -

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Title: Materials Research Society Symposium Proceedings

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