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  Determination of the depth scale in sputter depth profiling (The sputtered depth in depth profiling)

Hofmann, S., & Wang, J. (2002). Determination of the depth scale in sputter depth profiling (The sputtered depth in depth profiling). Journal of Surface Analysis, 9, 306-309.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-3354-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-3355-0
Genre: Journal Article

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 Creators:
Hofmann, S.1, Author              
Wang, J.Y.1, Author              
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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 Dates: 2002
 Publication Status: Published in print
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 Identifiers: eDoc: 34897
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Title: Journal of Surface Analysis
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 9 Sequence Number: - Start / End Page: 306 - 309 Identifier: -