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  Focussed ion beam methods applied to biological materials: sample preparation and investigation

Wegst, U. G. K., Heiland, B., & Arzt, E. (2002). Focussed ion beam methods applied to biological materials: sample preparation and investigation. In J. Engelbrecht, T. Sevell, M. Witcomb, R. Cross, & P. Richards (Eds.), Proceedings of the 15th International Congress on Electron Microscopy (ICEM 15). Vol. 1. Physics and Materials (pp. 607-608). Onderstepoort: Microscopy Society of Southern Africa.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3379-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-337A-D
Genre: Conference Paper

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34-ar_2002.pdf (Abstract), 48KB
 
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 Creators:
Wegst, U. G. K.1, Author           
Heiland, B.1, Author           
Arzt, E.1, 2, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
 Abstract: -

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Language(s): eng - English
 Dates: 2002
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 126162
 Degree: -

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Title: ICEM 15. 15th International Congress on Electron Microscopy
Place of Event: Durban, South Africa
Start-/End Date: 2002-09-01 - 2002-09-06

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Title: Proceedings of the 15th International Congress on Electron Microscopy (ICEM 15). Vol. 1. Physics and Materials
Source Genre: Proceedings
 Creator(s):
Engelbrecht, J., Editor
Sevell, T., Editor
Witcomb, M., Editor
Cross, R., Editor
Richards, P., Editor
Affiliations:
-
Publ. Info: Onderstepoort : Microscopy Society of Southern Africa
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 607 - 608 Identifier: -