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  X-ray and neutron scattering study of Si-rich Si-Ge single crystals

Le Bolloc'h, D., Robertson, J. L., Reichert, H., Moss, S. C., & Crow, M. L. (2001). X-ray and neutron scattering study of Si-rich Si-Ge single crystals. Physical Review B, 63: 035204.

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Genre: Journal Article
Alternative Title : Phys. Rev. B

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 Creators:
Le Bolloc'h, D.1, Author
Robertson, J. L.1, Author
Reichert, H.2, Author           
Moss, S. C.1, Author
Crow, M. L.1, Author
Affiliations:
1European Synchrotron Radiat Facil, BP 220, F-38043 Grenoble,; France; Univ Houston, Dept Phys, Houston, TX 77204 USA; Oak Ridge Natl Lab, Div Solid State, Oak Ridge, TN 37831 USA;, ou_persistent22              
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              

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Free keywords: MPI für Metallforschung; Abt. Dosch;
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Language(s): eng - English
 Dates: 2001-01-15
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 21805
ISI: 000166608600046
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Title: Physical Review B
  Alternative Title : Phys. Rev. B
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 63 Sequence Number: 035204 Start / End Page: - Identifier: ISSN: 0163-1829