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  Electromigration in interconnets

Volkert, C. A. (2001). Electromigration in interconnets. In K. Buschow, R. Cahn, M. Flemings, B. Ilschner, E. Kramer, & S. Mahajan (Eds.), Encyclopedia of Materials: Science and Technology (pp. 2550-2557). Oxford, UK: Elsevier Science Ltd.

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37-ar_2001.pdf (Abstract), 45KB
 
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 Creators:
Volkert, C. A.1, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
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Language(s): eng - English
 Dates: 2001
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 25901
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Title: Encyclopedia of Materials: Science and Technology
Source Genre: Book
 Creator(s):
Buschow, K.H.J., Editor
Cahn, R.W., Editor
Flemings, M.C., Editor
Ilschner, B., Editor
Kramer, E.J., Editor
Mahajan, S., Editor
Affiliations:
-
Publ. Info: Oxford, UK : Elsevier Science Ltd.
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 2550 - 2557 Identifier: -