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  Depth Profiling

Hofmann, S. (2001). Depth Profiling. In K. J. Buschow, R. Cahn, M. Flemings, B. Ilschner, E. Kramer, & S. Mahajan (Eds.), Encyclopedia of Materials: Science and Technology (pp. 2078-2089). Amsterdam, The Netherlands: Elsevier.

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 Creators:
Hofmann, S.1, Author              
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
 Abstract: -

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Language(s): eng - English
 Dates: 2001
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 35128
 Degree: -

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Title: Encyclopedia of Materials: Science and Technology
Source Genre: Book
 Creator(s):
Buschow, K.H. J., Editor
Cahn, R.W., Editor
Flemings, M.C., Editor
Ilschner, B., Editor
Kramer, E.J., Editor
Mahajan, S., Editor
Affiliations:
-
Publ. Info: Amsterdam, The Netherlands : Elsevier
Pages: - Volume / Issue: 3 Sequence Number: - Start / End Page: 2078 - 2089 Identifier: -