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  Diffraction-line broadening analysis of dislocation configurations

Vermeulen, A., Delhez, R., Keijser, T. d., & Mittemeijer, E. (2000). Diffraction-line broadening analysis of dislocation configurations. In R. Snyder, J. Fiala, & H. Bunge (Eds.), Defect and Microstructure Analysis by Diffraction (pp. 200-213). Oxford: Oxford University Press.

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 Creators:
Vermeulen, A.C., Author
Delhez, R., Author
Keijser, Th.H. de, Author
Mittemeijer, E.J.1, 2, Author              
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2000-01-06
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 220908
 Degree: -

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Title: Defect and Microstructure Analysis by Diffraction
Source Genre: Book
 Creator(s):
Snyder, R.L., Editor
Fiala, J., Editor
Bunge, H.J., Editor
Affiliations:
-
Publ. Info: Oxford : Oxford University Press
Pages: 808 Volume / Issue: - Sequence Number: - Start / End Page: 200 - 213 Identifier: -