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  The effect of film thickness on stress and transformation behavior in cobalt thin films

Hesemann, H., Müllner, P., Kraft, O., & Arzt, E. (2000). The effect of film thickness on stress and transformation behavior in cobalt thin films. In R. Vinci (Ed.), Thin Films - Stresses and Mechanical Properties VIII (pp. 219-224). Pittsburgh, Pa.: MRS.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-37B6-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-37B7-0
Genre: Conference Paper

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 Creators:
Hesemann, H.1, Author              
Müllner, P.1, Author              
Kraft, O.1, Author              
Arzt, E.1, 2, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
 Abstract: -

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Language(s): eng - English
 Dates: 2000
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 46656
 Degree: -

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Title: Thin Films - Stresses and Mechanical Properties VIIII. Symposium
Place of Event: Pittsburgh, Pa.
Start-/End Date: 1999-11-29 - 1999-12-03

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Title: Thin Films - Stresses and Mechanical Properties VIII
Source Genre: Proceedings
 Creator(s):
Vinci, R., Editor
Affiliations:
-
Publ. Info: Pittsburgh, Pa. : MRS
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 219 - 224 Identifier: -

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Title: Materials Research Society Symposium Proceedings
Source Genre: Series
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Publ. Info: -
Pages: - Volume / Issue: 594 Sequence Number: - Start / End Page: - Identifier: -