Direct strain measurements in InP/GaInP quantum dots by HREM

Jin-Phillipp, N. Y.; Phillipp, F.

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Direct strain measurements in InP/GaInP quantum dots by HREM

Jin-Phillipp, N. Y., & Phillipp, F. (2000). Direct strain measurements in InP/GaInP quantum dots by HREM. In P. Ciampor, L. Frank, J. Gemperlova, & I. Vavra (Eds.), Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences (pp. 299-300). Brno: Czechoslovak Society for Electron Microscopy.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-37BE-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-37C0-9

Genre: Conference Paper

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Creators:
Jin-Phillipp, N. Y.¹, Author
Phillipp, F.¹, Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657

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Free keywords: MPI für Metallforschung; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;

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Language(s): eng - English

Dates: Date issued: 2000

Publication Status: Issued

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Rev. Type: -

Identifiers: eDoc: 46907

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Title: 12th European Congress on Electron Microscopy (EUREM2000)

Place of Event: Brno [Czech Republic]

Start-/End Date: 2000-07-09 - 2000-07-14

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Title: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences

Source Genre: Proceedings

Creator(s):
Ciampor, P., Editor
Frank, L., Editor
Gemperlova, J., Editor
Vavra, I., Editor

Affiliations:
-

Publ. Info: Brno : Czechoslovak Society for Electron Microscopy

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 299 - 300 Identifier: -