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  Interface-structure studies by atomic-resolution electron microscopy, order-disorder phenomena, and atomic diffusion in gas-phase-synthesized nanocrystalline solids

Schaefer, H.-E., Reimann, K., Straub, W., Phillipp, F., Tanimoto, H., Brossmann, U., et al. (2000). Interface-structure studies by atomic-resolution electron microscopy, order-disorder phenomena, and atomic diffusion in gas-phase-synthesized nanocrystalline solids. Materials Science and Engineering A, 286, 24-33.

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 Creators:
Schaefer, H.-E.1, Author
Reimann, K.1, Author
Straub, W.1, Author
Phillipp, F.2, Author           
Tanimoto, H.1, Author
Brossmann, U.3, Author           
Würschum, R.1, Author
Affiliations:
1Institut für Theoretische und Angewandte Physik, Universität Stuttgart, Stuttgart, Germany, ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497657              
3Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648              

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Free keywords: MPI für Metallforschung; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;
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Language(s): eng - English
 Dates: 2000
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 198718
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Title: Materials Science and Engineering A
Source Genre: Journal
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Pages: - Volume / Issue: 286 Sequence Number: - Start / End Page: 24 - 33 Identifier: -