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  Scanning tunneling microscopy of chromium-filled carbon nanotubes: Tip effects and related topographic features

Zha, F.-X., Czerw, R., Carroll, D. L., Kohler-Redlich, P., Wei, B.-Q., Loiseau, A., et al. (2000). Scanning tunneling microscopy of chromium-filled carbon nanotubes: Tip effects and related topographic features. Physical Review B, 61, 4884-4889.

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Zha, F.-X., Author
Czerw, R., Author
Carroll, D. L., Author
Kohler-Redlich, P.1, Author              
Wei, B.-Q., Author
Loiseau, A., Author
Roth, S., Author
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Free keywords: MPI für Metallforschung; Ehemalige Abt. Rühle;
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Language(s): eng - English
 Dates: 2000
 Publication Status: Published in print
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 Rev. Type: Peer
 Identifiers: eDoc: 198733
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Title: Physical Review B
Source Genre: Journal
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Pages: - Volume / Issue: 61 Sequence Number: - Start / End Page: 4884 - 4889 Identifier: -