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  Stress in thin films; X-ray diffraction analysis and grain interaction

Welzel, U., Leoni, M., Lamparter, P., & Mittemeijer, E. J. (2000). Stress in thin films; X-ray diffraction analysis and grain interaction. Powder Diffraction Newsletter, 24, 4-6.

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 Creators:
Welzel, U.1, Author              
Leoni, M., Author
Lamparter, P.1, Author              
Mittemeijer, E. J.1, 2, Author              
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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 Dates: 2000
 Publication Status: Published in print
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 Identifiers: eDoc: 200648
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Title: Powder Diffraction Newsletter
Source Genre: Journal
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Pages: - Volume / Issue: 24 Sequence Number: - Start / End Page: 4 - 6 Identifier: -