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  Correlating the structural, chemical, and optical properties at nanometer resolution

Gu, L., Özdöl, V. B., Sigle, W., Koch, C. T., Srot, V., & van Aken, P. A. (2010). Correlating the structural, chemical, and optical properties at nanometer resolution. Journal of Applied Physics, 107: 013501. doi:10.1063/1.3275048.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3B2F-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3B30-D
Genre: Journal Article

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 Creators:
Gu, L.1, Author           
Özdöl, V. B.1, Author           
Sigle, W.1, 2, Author           
Koch, C. T.1, 2, Author           
Srot, V.1, 2, Author           
van Aken, P. A.1, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);
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Language(s): eng - English
 Dates: 2010-01
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 442463
DOI: 10.1063/1.3275048
 Degree: -

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Title: Journal of Applied Physics
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 107 Sequence Number: 013501 Start / End Page: - Identifier: -