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  Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers

Łaszcz, A., Czerwinski, A., Ratajczak, J., Szerling, A., Phillipp, F., van Aken, P. A., et al. (2010). Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers. Journal of Microscopy, 237(3), 347-351.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3B67-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3B69-F
Genre: Conference Paper

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 Creators:
Łaszcz, A.1, Author
Czerwinski, A.1, Author
Ratajczak, J.1, Author
Szerling, A.1, Author
Phillipp, F.2, Author           
van Aken, P. A.2, Author           
Katcki, J.1, Author
Affiliations:
1Institute of Electron Technology, Al. Lotnikow 32/46, 02–668 Warsaw, Poland., ou_persistent22              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

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Language(s): eng - English
 Dates: 2010
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 458891
DOI: 10.1111/j.1365-2818.2009.03258.x
 Degree: -

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Title: EM 2008 - XIII International Conference on Electron Microscopy
Place of Event: Zakopane, Poland
Start-/End Date: 2008-06-08 - 2008-06-11

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Title: Journal of Microscopy
Source Genre: Journal
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 237 (3) Sequence Number: - Start / End Page: 347 - 351 Identifier: -