Microstructural and residual stress development in thin films

Regniet, D.

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Microstructural and residual stress development in thin films

Regniet, D. (2009). Microstructural and residual stress development in thin films. Diploma Thesis, Universität Stuttgart, Stuttgart.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3C77-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3C78-5

Genre: Thesis

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Creators:
Regniet, D.¹, Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;

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Language(s): eng - English

Dates: Accepted: 2009-11-12

Publication Status: Accepted / In Press

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Publishing info: Stuttgart : Universität Stuttgart

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Rev. Type: -

Identifiers: eDoc: 439698

Degree: Diploma

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