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  Surface plasmon resonance effects in a perforated Ag film studied by energy-filtering TEM

Sigle, W., Nelayah, J., Koch, C. T., Ögüt, B., & van Aken, P. A. (2009). Surface plasmon resonance effects in a perforated Ag film studied by energy-filtering TEM. In G. Kothleitner, & M. Leisch (Eds.), MC2009. Vol. 1: Instrumentation and Methodology (pp. 111-112). Graz: Verlag der Technischen Universität Graz, Austria.

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 Creators:
Sigle, W.1, 2, Author           
Nelayah, J.2, Author           
Koch, C. T.1, 2, Author           
Ögüt, B.2, Author           
van Aken, P. A.2, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 435824
DOI: 10.3217/978-3-85125-062-6-054
 Degree: -

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Title: MC2009, Microscopy Conference
Place of Event: Graz, Austria
Start-/End Date: 2009-08-30 - 2009-09-04

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Title: MC2009. Vol. 1: Instrumentation and Methodology
Source Genre: Proceedings
 Creator(s):
Kothleitner, G., Editor
Leisch, M., Editor
Affiliations:
-
Publ. Info: Graz : Verlag der Technischen Universität Graz, Austria
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 111 - 112 Identifier: -