English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Strain measurements on Si/SiGe heterostructures using HRTEM

Özdöl, V. B., Koch, C. T., Phillipp, F., & van Aken, P. A. (2009). Strain measurements on Si/SiGe heterostructures using HRTEM. In W. Grogger, F. Hofer, & P. Pölt (Eds.), MC2009. Vol. 3: Materials Science (pp. 447-448). Graz: Verlag der Technischen Universität Graz, Austria.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-3E1F-3 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-3E20-E
Genre: Conference Paper

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Özdöl, V. B.1, Author              
Koch, C. T.1, Author              
Phillipp, F.1, Author              
van Aken, P. A.1, Author              
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

Content

show
hide
Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

Details

show
hide
Language(s): eng - English
 Dates: 2009
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Internal
 Identifiers: eDoc: 435834
DOI: 10.3217/978-3-85125-062-6-596
 Degree: -

Event

show
hide
Title: MC2009, Microscopy Conference
Place of Event: Graz, Austria
Start-/End Date: 2009-08-30 - 2009-09-04

Legal Case

show

Project information

show

Source 1

show
hide
Title: MC2009. Vol. 3: Materials Science
Source Genre: Proceedings
 Creator(s):
Grogger, W., Editor
Hofer, F., Editor
Pölt, P., Editor
Affiliations:
-
Publ. Info: Graz : Verlag der Technischen Universität Graz, Austria
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 447 - 448 Identifier: -