English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse
  1. Item Summary / 
  2. View item

Item

ITEM ACTIONSEXPORT
Add to Basket
 Local TagsRelease HistoryDetailsSummary
  Application of monochromated electrons in EELS

Sigle, W., Gu, L., Koch, C., Srot, V., Nelayah, J., & van Aken, P. A. (2008). Application of monochromated electrons in EELS. Microscopy and Microanalysis, (Supplement S2), 134-135.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-40DB-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-40DC-A
Genre: Conference Paper

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Sigle, W.1, 2, Author           
Gu, L.2, Author           
Koch, C.1, 2, Author           
Srot, V.1, 2, Author           
Nelayah, J.2, Author           
van Aken, P. A.2, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

Content

show
hide
Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

Details

show
hide
Language(s): eng - English
 Dates: 2008
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 372672
 Degree: -

Event

show
hide
Title: Microscopy and Microanalysis 2008. Microscopy Society of America, 66th Annual Meeting. Microbeam Analysis Society, 42nd Annual Meeting. International Metallographic Society, 41st Annual Meeting
Place of Event: Albuquerque, New Mexico, USA
Start-/End Date: 2008-08-03 - 2008-08-07

Legal Case

show

Project information

show

Source 1

show
hide
Title: Microscopy and Microanalysis
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Cambridge, UK [et al.] : Cambridge Press
Pages: - Volume / Issue: (Supplement S2) Sequence Number: - Start / End Page: 134 - 135 Identifier: -

Source 2

show
hide
Title: Proceedings Microscopy and Microanalysis 2008
Source Genre: Proceedings
 Creator(s):
Marko, M., Editor
McKernan, S., Editor
Shields, J., Editor
Scott, J.-H., Editor
Kotula, P., Editor
Anderson, I., Editor
Woodward, J., Editor
Affiliations:
-
Publ. Info: Cambridge, UK [et al.] : Cambridge Press
Pages: - Volume / Issue: (Supplement S2) Sequence Number: - Start / End Page: 134 - 135 Identifier: -