In-situ atomic resolution HVEM studies of strontium titanate at high 
temperatures

Phillipp, F.; Bellina, P. J.; Lee, S. B.; Messer, R.; van Aken, P. A.

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In-situ atomic resolution HVEM studies of strontium titanate at high temperatures

Phillipp, F., Bellina, P. J., Lee, S. B., Messer, R., & van Aken, P. A. (2008). In-situ atomic resolution HVEM studies of strontium titanate at high temperatures. Korean Journal of Microscopy, 38(4, Supplement), 102-103.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4156-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4157-C

Genre: Conference Paper

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Creators:
Phillipp, F.¹, Author
Bellina, P. J.¹, Author
Lee, S. B., Author
Messer, R.², Author
van Aken, P. A.¹, Author

Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
2School of Materials Science and Engineering, Seoul; National University, Seoul 151-744, SouthKorea;University of Cooperative Education, Jägerstraße 56, D-70174 Stuttgart, Germany, ou_persistent22

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);

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Language(s): eng - English

Dates: Date issued: 2008

Publication Status: Issued

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Rev. Type: Internal

Identifiers: eDoc: 391269

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Title: The 9th Asia-Pacific Microscopy Conference (APMC9)

Place of Event: Jeju, South Korea

Start-/End Date: 2008-11-02 - 2008-11-07

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Title: Korean Journal of Microscopy

Source Genre: Journal

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Pages: - Volume / Issue: 38 (4, Supplement) Sequence Number: - Start / End Page: 102 - 103 Identifier: -