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  In-situ atomic resolution HVEM studies of strontium titanate at high temperatures

Phillipp, F., Bellina, P. J., Lee, S. B., Messer, R., & van Aken, P. A. (2008). In-situ atomic resolution HVEM studies of strontium titanate at high temperatures. Korean Journal of Microscopy, 38(4, Supplement), 102-103.

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 Creators:
Phillipp, F.1, Author              
Bellina, P. J.1, Author              
Lee, S. B., Author              
Messer, R.2, Author
van Aken, P. A.1, Author              
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2School of Materials Science and Engineering, Seoul; National University, Seoul 151-744, SouthKorea;University of Cooperative Education, Jägerstraße 56, D-70174 Stuttgart, Germany, ou_persistent22              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

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Language(s): eng - English
 Dates: 2008
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 391269
 Degree: -

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Title: The 9th Asia-Pacific Microscopy Conference (APMC9)
Place of Event: Jeju, South Korea
Start-/End Date: 2008-11-02 - 2008-11-07

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Title: Korean Journal of Microscopy
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 38 (4, Supplement) Sequence Number: - Start / End Page: 102 - 103 Identifier: -