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  Aspects regarding measurement of thickness of intergranular glassy films

Bhattacharyya, S., Subramaniam, A., Koch, C. T., & Rühle, M. (2006). Aspects regarding measurement of thickness of intergranular glassy films. Journal of Microscopy, 221, 46-62.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-46B9-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-46BA-2
Genre: Journal Article
Alternative Title : J. Microsc.

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 Creators:
Bhattacharyya, S.1, Author           
Subramaniam, A.1, Author           
Koch, C. T.1, 2, Author           
Rühle, M.3, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
3Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM); Emeriti and Others;
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 282014
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Title: Journal of Microscopy
  Alternative Title : J. Microsc.
Source Genre: Journal
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 221 Sequence Number: - Start / End Page: 46 - 62 Identifier: -