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  Determination of projected potential profiles across interfaces using through focal series reconstruction

Bhattacharyya, S., Koch, C. T., & Rühle, M. (2006). Determination of projected potential profiles across interfaces using through focal series reconstruction. Microscopy and Microanalysis, 12(Suppl. 2: Proceedings), 1016-1017.

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 Creators:
Bhattacharyya, S., Author           
Koch, C. T.1, Author           
Rühle, M.2, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              

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Free keywords: MPI für Metallforschung; Emeriti and Others; Stuttgart Center for Electron Microscopy (StEM);
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
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 Rev. Type: -
 Identifiers: eDoc: 288646
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Title: Microscopy and Microanalysis
Source Genre: Journal
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Pages: - Volume / Issue: 12 (Suppl. 2: Proceedings) Sequence Number: - Start / End Page: 1016 - 1017 Identifier: -