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  EELS and EDX study of Pt/YSZ interfaces

Srot, V., Scheu, C., Tchernychova, E., Sigle, W., Fischer, H., Janek, J., et al. (2006). EELS and EDX study of Pt/YSZ interfaces. In Proceedings of the 16th International Microscopy Congress 2006 (pp. 1321-1321). International Federation of Societies in Microscopy.

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 Creators:
Srot, V.1, Author           
Scheu, C., Author           
Tchernychova, E., Author           
Sigle, W.1, Author           
Fischer, H.2, Author
Janek, J.2, Author
Rühle, M.3, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2Jozef Stefan Institute, Jamova 39, Ljubljana, Slovenia;Department Physical Metallurgy and Materials Testing, University of Leoben, Franz-Josef-Straße 18, Leoben, Austria;Materials Research Center, University Lehigh, 5 East Packer Avenue, Bethlehem, PA, USA;Research Institute for Electron Microscopy, Graz University of Technology,Steyerergasse 17, 8010 Graz, Austria;Physikalisch-Chemisches Institut, Justus-Liebig-Universität Gießen, Heinrich-Buff-ring 58, Gießen, Germany, ou_persistent22              
3Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              

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Free keywords: MPI für Metallforschung; Emeriti and Others; Stuttgart Center for Electron Microscopy (StEM);
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 318175
 Degree: -

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Title: 16th International Microscopy Congress - IMC16
Place of Event: Sapporo, Japan
Start-/End Date: 2006-09-03 - 2006-09-08

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Title: Proceedings of the 16th International Microscopy Congress 2006
Source Genre: Proceedings
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Publ. Info: International Federation of Societies in Microscopy
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1321 - 1321 Identifier: -