Analysis of the diffusion profile along migrating grain boundaries

Lopez, G. A.; Zieba, P.; Sigle, W.; Mittemeijer, E. J.

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Analysis of the diffusion profile along migrating grain boundaries

Lopez, G. A., Zieba, P., Sigle, W., & Mittemeijer, E. J. (2005). Analysis of the diffusion profile along migrating grain boundaries. Defect and Diffusion Forum, 237-240, 1230-1233.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4981-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4982-6

Genre: Journal Article

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Creators:
Lopez, G. A.¹, Author
Zieba, P.², Author
Sigle, W.^{3, 4}, Author
Mittemeijer, E. J.^{1, 5}, Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
2Institute of Metallurgy and Materials Science, Polish Academy of Sciences, Cracow, Poland, ou_persistent22
3Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
4Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
5Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22

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Free keywords: MPI für Metallforschung; MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM); Abt. Mittemeijer;

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Language(s): eng - English

Dates: Date issued: 2005

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 332660

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Title: Defect and Diffusion Forum

Source Genre: Journal

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Pages: - Volume / Issue: 237-240 Sequence Number: - Start / End Page: 1230 - 1233 Identifier: -