Transmission X-ray microscopy using X-MCD

Eimüller, T.; Fischer, P.; Köhler, M.; Scholz, M.; Guttmann, P.; Denbeaux, G.; Glück, S.; Bayreuther, G.; Schmahl, G.; Attwood, D.; Schütz, G.

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Transmission X-ray microscopy using X-MCD

Eimüller, T., Fischer, P., Köhler, M., Scholz, M., Guttmann, P., Denbeaux, G., et al. (2001). Transmission X-ray microscopy using X-MCD. Applied Physics A, 73, 697-701.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-49EA-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-49EB-D

Genre: Journal Article

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Creators:
Eimüller, T.¹, Author
Fischer, P.¹, Author
Köhler, M., Author
Scholz, M., Author
Guttmann, P., Author
Denbeaux, G., Author
Glück, S., Author
Bayreuther, G., Author
Schmahl, G., Author
Attwood, D., Author
Schütz, G.¹, Author

Affiliations:
1Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648

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Free keywords: MPI für Metallforschung; Abt. Schütz;

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Language(s): eng - English

Dates: Date issued: 2001

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 250765

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Title: Applied Physics A

Source Genre: Journal

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Pages: - Volume / Issue: 73 Sequence Number: - Start / End Page: 697 - 701 Identifier: -